ict and fct test

Une gamme d'interfaces de test avec kits interchangeables conçue pour les tests FCT / ICT de petite et moyenne série. Bi-Level or Multi-Stage -These fixtures are perfect for single or dual sided boards that need to be tested powered, non-powered, functional or in-circuit in different stages. Feature 6 According to customers' requirements, Myzy can designed the test fixtures with dual opening, which is convenient fand feasible for operation. The World Bank Group brings together knowledge and expertise across all major sectors of development. Our goal is to help developing countries find solutions to the toughest global and local development challenges—from adapting to climate change to boosting food security or fighting corruption. Browse by development topics listed below or Definition of the best test strategy in function of production volumes. Design and debug application testing ICT. Production monitoring to improve coverage and efficiency of the test. FCT (Functional Circuit Test) Acquisition test specifications issued by the customer. Analysis of technical / economic feasibility. The study examined the principals' utilization of information and communication technology (ICT) resources in public and private senior secondary schools in Federal Capital Territory (FCT), memperbaiki dan melengkapi teks prosedur membuat angklung. In-Circuit Testing ICT is an established method of analysing an electronic product in production. Typically, a bed-of-nails approach is used to test a non-powered circuit board and techniques such as Direct Digital Synthesis DDS and Discrete Fourier Transform DFT are used to generate stimulus signals and to perform analogue measurement analysis. This allows the In-Circuit Analyser ICA to measure real-world attributes such as inductance, capacitance, impedance and resistance to check if all of the Device Under Test DUT test node results are within tolerance and if any component is open, shorted, incorrect or misoriented, all without having to power up the DUT. The interconnection between the nail contacts and the relevant analogue channel or digital Driver/Sensor D/S on the pin board is accomplished by using a relay multiplexer Figure 1. Figure 1 Typical bed-of-nails 2x16 relay multiplexer only one channel shown in the diagram In some more advanced systems, the ICA module can also be used to carry out limited functional component testing FCT by applying power to the device and measuring the input and output characteristics under load. More often, this test is done separately with a second test adapter. There are several practical reasons for doing this Firstly, the ICT bed-of-nails probes are not rated to carry the necessary supply voltage or load current to carry out a full function test on powered-up devices. A dedicated FCT test-bed will have heavy-duty contacts designed to carry higher currents or voltages without overheating, arcing or suffering from excessive wear. The disadvantage is that these heavy-duty contacts take up more space and therefore FCT test adapters typically check only one DUT at a time. Secondly, the ICA internal programmable power supplies, relays and electronic loads are also not designed for high current testing. If the power supply units are simply swapped out for more powerful versions, the higher current can cause serious interference problems with the sensitive ICT analogue measurements, including introduction of measurement inaccuracies due to ground-bounce, voltage drop along wiring and through transients generated from switching inductive loads. The measurements carried out in a dedicated FCT adapter are usually lower resolution with heavier filtering, so they are less sensitive to interference. Also, the power supplies and relay contacts are more robust and able to switch more than one amp. Thirdly, the relay interface hardware and software control used to change the relay configuration is typically via a Parallel Input Output PIO controller and relay driver Figure 2. For ICT applications, the relay switching speed is not usually an issue as the relays are mainly reconfigured at the end of each DUT test to multiplex connections from one pin assembly to the next. However, in an FCT test adapter, the relays are used to change the functional test setup for each separate test on each DUT, so the control data throughput to the relays is higher. In a dedicated FCT set-up, this is not an issue as only one DUT is checked at a time, but if multiple devices are going to be tested in a combined ICT/FCT adapter, then the speed limitation of the relay control is a major bottleneck. Figure 2 Test System Block Diagram Finally, while ICT measurements can be made in milliseconds, FCT procedures are typically much slower as measurements made while the unit is powered up cannot be made instantaneously; the outputs have to settle before a reliable measurement can be taken. Typically, the FCT process will take five to ten times as long as ICT to complete for the same product. If the testing is combined in one ICT/FCT platform, then the FCT part could be a bottleneck in production. If the two processes are separated, then one ICT machine could feed several FCT testbeds used in parallel to increase the throughput and reduce the bottleneck. Nevertheless, for a newly developed DC/DC product series developed by the Austrian company Recom Power, the additional cost and testing time for two separate test adapters was not acceptable. A way had to be found to combine the high speed advantage of ICT with the practical quality assurance of 100% functional testing, all in one test adapter. This was technically a complex challenge the product series covered devices with up to 6A output current and input voltages up to 60V. Each PCB panel contained forty partly-finished modules which meant that parallel testing was required using heavy-duty power supplies. The data throughput was therefore not only very high but any timing errors could be problematic. Recom contracted Elmatest in the Czech Republic to build a combined ICT/FCT test adapter for the Teledyne Teststation LH used by the EMS provider. From the beginning, Zdenek Martinek, the application engineer at Elmatest, realised that this was no ordinary project. There were several significant problems that needed to be solved how to combine ICT/FCT in one multi-panel, how to handle the high relay control throughput, how to accelerate the FCT process and how to cope with the high power levels without harming the sensitive probes. In close co-operation with Markus Stöger from Recom’s R&D department, a solution was found for all of these issues. The first problem that needed to be solved was how to combine ICT/FCT in the multi-panel design of the product. Each PCB contained 40 independent circuits. These modules were not part-built, but complete products, already finished, cased and screen printed and not all of the internal nodes were accessible to the ICT pin panel. This was deliberate. The DC/DC converter switches at high internal frequencies and it is integral to the product concept that the metal case and its multi-layer PCB forms a complete six-sided faraday cage to avoid EMI issues. Any external connections to an internal high frequency switching node would form a pathway for EMI to pass through the EMC seal and to radiate, possibly causing measurement errors. The solution to “How to ICT test an enclosed and inaccessible product?” was to create a test module on each multi-panel. The test module allows access to all of the ICT nodes necessary on the test module to verify that each panel is built correctly. Once the conventional ICT procedure is carried out on the test module, then the remaining modules need be FCT-checked only. Figure 3 Top and bottom images of the multi-panel PCB showing the ICT test module in the corner. The code required to carry out a single test and measurement process is called a test vector. The arrangement of the inputs, outputs and analogue channel configurations required to carry out the measurement is transmitted as a data burst’. These configurations are loaded into local on-board memory and then simultaneously activated by a timing strobe signal. This configuration is then latched until the test has been completed and the measurement data has been transferred back to the CPU. However, in the meantime, the next data burst can be pre-loaded into the registers to await the next strobe signal. This methodology is what allows ICT to achieve its very fast throughput of around 4µs per vector. However, the standard relay drivers used in the GenRad Teststation are driven from the Parallel Input/Output PIO controller which in turn is given commands from the controlling PC via a MXIbus Figure 2. This arrangement proved to be too slow for our project where we want to process different FCT measurements within a single test vector using the high speed System Controller to control the relay configuration. In order to accelerate the relay switching rate, a novel relay driver topology was implemented in the Recom test adapter, based on a technique called active burst’. In active burst, some of the relays are not driven from the PIO controller card, but driven directly from the D/S outputs which are kept active until the ICA measurements have been completed. Each D/S can be configured with 9 separate functions Idle, Drive low or high, Sense low or high, Hold, Drive with deep serial memory, Sense with deep serial memory and Collect CRC data, so in our case, we used the Drive function to directly power the relays. The D/S Drive output is limited to TTL voltage and current levels, normally not sufficient to operate a relay without a separate driver, but by building the test adapter using Darlington transistor current amplifier relay coils, the D/S modules were able to operate the relays directly, bypassing the PIO controller. This made the relay control practically instant and made the coding much simpler. The second problem that needed to be solved was how to accelerate the FCT part of the test; waiting for the analogue levels to settle would have made the overall testing still unacceptably slow. The technique used here was to use the processing power already inherent in the ICA system. Waveform generation and analysis techniques such Direct Digital Synthesis DDS and Discrete Fourier Transform DFT were used, which are inherently faster than any analogue bridge balancing measurement technique. The breakthrough was to realise that these same advanced techniques could also be used to determine the powered-up functional testing results. Instead of applying a fixed load, waiting for the output to stabilise and then measuring the input and output currents and voltages, the output load could be pulsed for a few milliseconds and the processed results used to derive the final output characteristics. This reduced the measurement time by up to 80%. Figure 4 6-Terminal Impedance Measurement One significant development issue was matching such dynamic load and supply switching with the ancient “spaghetti” software used in the GenRad test station, which is a mix of Pascal, Assembler and Basic. However, although GenRad ceased to exist as a separate company back in 2003, it is a tribute to the robustness of the design that even today it is possible to piggy-back state-of-the-art operating systems on top of the original hardware. The solution to the second problem also solved the third problem how to avoid damaging the sensitive probes. As the load current was pulsed only for a very short time, there was no noticeable local heating at the very fine contact area, even with 6A peak current through a probe rated at only two amps. The on-time/off-time ratio could also be programmed so that even with sequential measurements, the probe tip had time to cool down between pulses and would not burn or scorch. This pulsed load technique also meant that the power supplies were not overloaded. ICT is also used to measure the internal voltage divider resistances used to pre-set the output voltage, allowing the test system to automatically derive the output voltage, output current and input voltage range from ICT and then pass these values on to the FCT test program so that the appropriate functional testing can be carried out. This eliminates the possibility of operator error setting the FCT variables out-of-range and damaging either the product or the expensive pin boards or programmable power supplies. The net result of all of these techniques is a combined ICT/FCT test time of between and seconds per DC/DC module, meaning that a complete PCB multi-panel can be 100% tested in less than 80 seconds, including removal of the tested PCB and placement of the next PCB to be tested into the test adapter. With a minimum production run of 5000, the cumulative time-saving has been instrumental in the resulting success of the entire product series. So much so, that the initial design of the RPM module has now been extended from a single series with eight variants to three different series with a total of twenty-two variants, all sharing the same footprint and test adapter. Figure 5 The finished test adapter in action RECOM We Power your Products What is ICT and FCT in PCB assembly test April 08 , 2021 Before the PCB assembly product is delivered to the customer, it must be rigorously tested. PCB assembly testing is the key to ensuring the quality of shipments. Customers will provide a test plan for us,there are including test points, procedures and test steps. In PCB assembly testing, FCT functional testing and ICT electrical component testing are the most common. ICT test： The ICT test of the PCB assembly is mainly through the test probe contacting the test point on the PCB boardwith components, which can detect the short circuit, the open circuit and the component welding and other fault problems. ICT is characterized by fast, accurate, high-tempo, and the test can be completed in about 3 to 5 seconds. It is controlled by a computer program to accurately measure, reduce the risk of misjudgment and missed measurement, and reduce the troubles of the production line. ICT can know which part or which circuit is connected through a computer program to facilitate maintenance, speed up the production process, reduce time costs, and improve product quality. FCT test： In PCB assembly, FCT function test is a test tool, which is divided into two parts, one is the main part and the other is the test fixture part. The main part includes a computer system and a signal sampling system. The PCB boardwith components is mainly placed on the test rack, and the test points on the PCB boardwith components is captured by the test fixture, so as to provide a simulation operating environment such as excitation and load through the PCB boardwith components . The board's various status parameters can be obtained through the FCT function tester to detect the board Whether the functional parameters meet the design requirements, the test fixture part has a fixed size, and the positioning holes are made according to different target test boards. To test different PCB boardwith components , you only need to change the test fixture, and then call up the corresponding test program on the computer. FCT function test items mainly include voltage, current, power, power factor, frequency, duty cycle, brightness and color, character recognition, voice recognition, temperature measurement, pressure measurement, motion control, FLASH and EEPROM burning, etc. The testing process is all done automatically by the computer. Both efficiency and pass rate are guaranteed. Previous Post What is the difference between PCBA wave soldering and manual soldering Next Post PCBA SMT Production Process Introduction The FCT Test in which the PCBA is powered up is referred to as an FCT. Among the features are voltage, current measurement and control, power factors, frequency and duty ratio, position determination, LED lighting, LED color, sound recognition, temperature, and pressure measurement control, etc. What's more essential than adhering to PCB manufacturing's highest quality requirements is ensuring that your board functions as intended. This necessitates a series of tests to be carried out at different phases, including development, production, and assembly. There are a variety of functional tests that may be performed on a PCB to ensure that it is working correctly. To enable PCB functional testing, the manufacturer may also need to alter the design of the PCB. Sending the design files back and forth should be simple as long as the manufacturer is aware of your device's functional specifications and the testing procedures you've established. Of course, a cloud-based solution for data access is the ideal option. Classification of Functional Tests In order to accommodate a variety of control modes 1）Manually control functional tests 2）Semi-automatic control function test 3）Fully automatic control function test The early function tests are mostly automated or semi-automatic, with a few exceptions. Manual and semi-automatic methods are still used to simplify the design and lower manufacturing costs. In order to reduce money and increase production efficiency, many functional tests have been automated. For a different kind of controller A microprocessor controller Embedded CPU controllers are also available PC controller PLC Control Why Do We Perform Functional Tests? Manufacturers use functional testing FCT to ensure their products are of high quality. Predefined standards for the future use of DUTs are scrutinized throughout the testing process to ensure they are up to snuff. In addition to functional testing, a DUT is recommended to be subjected to undesired conditions in order to see how it responds e. g. switching off on overvoltage. If a functional item is being manufactured, functional tests are often conducted at the end of the manufacturing line. How Are Functional Tests Performed? During functional testing, a DUT's response to various external stimuli relevant to its intended use is evaluated in great detail. If the anticipated behaviour is met, it passes the test. These are some of the most often cited influences At the electrical inputs e. g., voltage dips or interruptions Input signals in the form of digital data e. g. communication messages through KNX, DALI, CAN, I2C, Flexray, etc. Simulated user interface operations e. g., buttons, rotary controls Using sensors to interact e. g. NFC inclement weather e. g. high or low temperatures Differences From Other Methods Of Testing Other electrical tests that look for manufacturing flaws by evaluating physical characteristics rather than functional responses identification of incorrect soldering by assessing electrical resistances must be differentiated from functional testing. In-circuit testing ICT Using specialized needle bed adapters, many test locations may be contacted at the same time to inspect built PCBs. PBT using a flying probe FPT A few successive test points are performed when inspecting the constructed PCBs using universal flying probe testers. Functional Testing Requires What? The industrial FCT Test requires the following hardware and software A test control unit FCT tester that manages the DUT's exposure to external factors and records its responses accurately and in real-time e. g. our Guardian FCT tester Connecting the DUT test adapter to the control unit in a time-efficient or even automated manner is possible with this method e. g., test adapters by GTS Test Solutions Software for real-time examination of test sequences that may be programmed and executed e. g., WinGuard Sensors and systems such as color sensors are essential for the creation of the necessary environmental circumstances e. g. climatic chambers The FCT Machine Functional Circuit Test Functional Circuit Testing FCT is an approach to testing that offers a simulated operating environment for the test target board so that it may operate in predefined states and acquire parameters for each condition in order to validate the UUT. Functional testing of PCBAs is often referred to as PCB testing. Features In order to guarantee long-term performance and balance of action, it is best to choose pneumatic components from well-known brands. Drilling precision in high-CNC machining is limited to Slab, guard plate, and needle plate verticality are ensured by a linear bearing guide. Preventing mishaps via the use of both hands simultaneously You may save time and effort by using a quick clip as a power source with a well-balanced and simple operation. In terms of accuracy and throughput, CNC is unmatched. Use a linear bearing guide to ensure that the needle point is precisely centered. The base of the rack may be changed, allowing for simple adjustment. PCB Assembly Functional Testing Before the thermal aging test, a functional test FCT is performed. It is used to test the PCBA's functional performance in a working environment. Using PCB software, the following steps may be performed The PCB assembly is then connected to the PCBA tester by a test technician, who runs the test program and turns on the PCBA. In Visual Basic, our testing system is set up. The technician then uses the PCBA tester to read the signals from the PCB chips and route them to the test locations on the board. This is the most efficient method when using an oscilloscope to view the signal levels and voltage values. Using an oscilloscope linked to a computer, our expert may check for signal integrity and see whether voltages are running correctly by seeing if the screen shows okay or NG not good and if the PCBA is okay. There is a complete record of every step of the testing procedure. IC programming or thermal aging are the following steps in the PCB construction if the computer says so. Once our experts have debugged the computer, all PCBA testing is restarted. In most cases, we recommend functional testing to clients whose PCBs have an area of more than three square meters. It identifies any open connections, damaged components, solder shorts, and other issues with the PCB. PCB manufacturers use it to provide a high level of accuracy in the assembly process. Your PCB Assembly Benefits from FCT This is what you'll gain by working with the FCT The FCT saves the consumer from acquiring expensive testing equipment or hiring a testing business, which is significantly more costly. System testing is no longer required. " Everything that may go wrong with the PCB is covered here, including resistance and voltage, as well as communication methods. To add serial numbers and calibration factors at this point, manufacturers have the ability to do so. Any faults in the PCB's operating environment are removed during the FCT Test. Monitoring responses at certain moments ensures the product's operation and guarantees that it will not malfunction. This is critical for customers who may not be able to figure out the problem on their own. Benefits to Customers of Functional Testing In order to save money for the client, functional testing mimics the product's operational environment, reducing the need for costly testing equipment. When costly system testing is not required, the OEM saves a great deal of time and money. In order to save time and effort for the OEM, it may do a functional test on anywhere from 50 to 100 percent of the product being delivered. Functional testing may be made more productive than system testing by skilled engineers who know how to use it. ICT and flying probe tests may be enhanced by functional testing to make the product more reliable and error-free. By mimicking the product's operating context, a functional test ensures that the product functions correctly. The DUT's environment includes everything that can interact with it, such as the DUT's power supply or any software loads required for the DUT to operate effectively. The PCB is put through its paces by a series of signals and power sources. At certain moments, responses are checked to verify that everything works as it should. The OEM test engineer often creates the standards and test methods that are followed throughout the test. This test is the most effective at identifying incorrect component values, functional issues, and parametric issues. Automated functional testing is made possible by test software, which is also known as firmware by production line operators. An externally programmable instrument, such as an I/O board or digital multimeter, is used to connect with the software. An FCT Test may be performed using the instruments connected to the DUT through a fixture and software. Last Words Finally, the FCT Test is performed. Finished PCBs may be passed or failed using this test, and they can then be sent off. It is an FCT's job to ensure that the manufacturing process is free of faults that might harm the product's ability to perform properly in a system. Now that you've learned about PCBA functional testing, you should have a better grasp of the process. It might be a frustrating experience for the consumer if the whole PCB fails to operate. For example, the FCT mimics the circuit board's operational environment and helps you avoid any future mistakes. Customized FCT/ICT MachinesWe can provide you with flexible and comprehensive process of electronic products like PCB assembly testing machines through our great capabilities, customized particularly to your products' unique requirements. FCT Machine Functional Circuit TestFCT refers to the test method that provides the simulated operating environment to the test target board, so that it can work in designed states to obtain the parameters of each state to verify the function of the UUT. Generally refers to the functional test of well-known brand pneumatic components to ensure durability, balance of action save trouble and effortHighCNC machining drilling accuracy, the minimum error is bearing guide to maintain the verticality of the slab, guard plate and needle plateSimultaneous operation of both hands to prevent accidentsWith fast clip as power, balanced pressure, convenient operation, saving time and effortCNC has high processing precision and high efficiencyAdopt linear bearing guide to ensure the accuracy of the needle pointThe rack is easy to adjust and the base can be serializedYour Benefits Fully customized testing functions Touch probe accuracy up to ± Assemble accessories as requiredICT Machines Integrated Circuit Tester）ICT test fixture is to check the manufacturing defects and bad components with a standard test equipment. It is mainly used to check the open, short circuit components as well as a single-line circuit OfferWe specializes in the production of high-precision ICT fixtrue for ICT equipment type TRI, PTI, OKANO, Tescon, Takaya, Hioki, Hibex, Concord, JET, SRC, etc.,You can choose according to customer’s demand INGUN or QA probe customization of different materials, and do the deformation of the test fixtureYour BenefitsFast test speedPCBA can finish L/C/R/D test without power-on, which can effectively reduce the waiting time for test start-up, and can also reduce the accident of Burn-in Board caused by short circuit. A piece of PCBA board with 300 components can be tested within 3~5 on-site technical dependenceThe time and error of human operation are greatly reduced by computer control. The operator can easily operate the equipment and replace the test fixture by himself with a little product utilization rateBy quick testing, the immediate feedback of problem will pass to the SMT operation on time, reducing non-performing rate, reducing the stock inventory and the accumulation of defective testabilityControlled by computer programs for accurate measurement, the risk of misjudgment and missed measurement can be greatly reduced, as well as the trouble to the production the costs of repairsThe maintenance work can be done by average operators, effectively reducing personnel costs. ICT can tell problems of any part or Network through the computer product qualityWith enough test points, ICT can measure all the circuits and parts on PCBA board, even the components on the bypass line can also be tested, which can improve overall product Asked Questions1 What data is needed to make FCT/ICT jig?Please send the PCBGerber file or CAD data, BOM list file, a PCBA sample, and a sample picture of your previous FCT/ICT jig will be quite helpful+ -2What kind of material do you use to make the FCT/ICT jig?That’s depend on your requirement, FR4, bakelite, acrylic, and anti-static material are all available.+ -3What brand of pins do you use?INGUN, QA, LH, or Made-In-China pins+ -4 How long do you need to make the FCT/ICT jig?FCT jig will take 5-7days to produce; ICT jig will take 1-2 weeks to produce based on its difficulty.+ - Standard spring-loaded test probes GKS Standard probes GKS without collars have proven themselves time and again to be ideally suited for ICT and FCT. Depending on the working stroke of the test fixture or the components and test points to be contacted, different installation heights are necessary. These are achieved by the combination of test probe and receptacle. Only in this way can the optimum working stroke with nominal spring force be achieved. Long stroke probes In addition to the version with standard working stroke there are probes GKS with long working stroke which allow a combination of ICT and FCT in a dual-stage test fixture. If necessary, the signals are transferred to a transfer PCB via a spring-loaded plunger using wireless contact receptacles; this eliminates the need for wiring. Short/robust test probes Short/robust test probes are characterised by their durable, compact design. This makes these probes suitable for demanding ICT/ FCT applications with limited space as well as in larger grids. INGUN E-TYPE test probes INGUN E-TYPE test probes have a higher preload in comparison to standard test probes. This initial higher spring force guarantees reliable contact when the same load is reached the spring force is equal to that of the comparable standard test probe at working stroke. More information Rotating test probes Rotating test probes can provide a reliable alternative if contacting problems occur. A rotating movement during the stroke process scratches the surface to be contacted, which securely penetrates insulating layers, such as severe contamination or anodised aluminium. Bead Probe GKS So-called bead probes are used for contacting beads solder beads on printed circuit boards. Various tip styles are available for optimal testing of beads depending on their geometry, composition and surface. Fine pitch test probes Fine pitch test probes are used to contact very small test points in small grids. These are sometimes mounted without receptacles. Metric test probes Metric test probes metric standard supplement the classic ICT/FCT test probes without collars. They stand out due to their stability and robustness and all feature a pronounced collar. INGUN S-LineThe socketless series enables testing without receptacles. As a result, S-Line test probes fit in common grid sizes, despite being larger in diameter, and offer better mechanical durability. More information

ict and fct test